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    1.7.1 Light microscope images

    Images of etched specimen at 100, 200, 500 and 1000 times magnification. Single phase brass microstructure with grains aligned in the ED, but not as strict rows as previous materials. The etch effect of crystallographic orientations makes grains easy to distinguish. A family of small particles can be seen, this is Fe, Si and P particles according to EDS analysis. Lead particles are etched dark, they appear to be round and homogeneously distributed.

    Etching: 5g ferric chloride + 10ml conc. hydrochloric acid + 100 ml de-ionised water.

    Specimen surface was parallel with extrusion direction (X=ED). Position ¼ depth.

    CW709R, 100x Magnification
    CW709R, 200x Magnification
    CW709R, 500x Magnification
    CW709R, 1000x Magnification
    Composition of CW709R Composition of CW709R

    1.7.2 EBSD/EDS analysis in the SEM

     

     

    EBSD analysis with 1 µm step size

    The material show a homogeneous microstructure consisting of alpha phase, and lead particles. In this limited area it is difficult to make assumptions about texture.

    Specimen surface was parallel with extrusion direction (X=ED). Position ¼ depth.

    Surface was OP-S-polished.

    FSD image of the area for EBSD analysis. Streaks of Pb particles along ED is seen.
    IPF-Z EBSD map with colours according to crystal orientations in Z direction (transverse dir.).
    EBSD phase map, alpha phase is red and in this case only alpha was present. Grain boundaries (>15°) are included.
    EBSD map showing IPF in X direction (extrusion dir.).

    Grain- and phase boundaries

    In this material there is a tendency to have low angle boundaries. In the previous IPF maps there are shifts of colour within grains. The assumption would be that some plastic deformation occurred after recrystallisation during extrusion.

    Grain boundaries (>15°) are black.
Low angle boundaries (2-15°) are thin black.
Twin boundaries (60°<111V) are red. Grain boundaries (>15°) are black. Low angle boundaries (2-15°) are thin black. Twin boundaries (60°<111V) are red.

    EDS mapping in parallel to EBSD analysis

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    1.7.3 EBSD/EDS analysis in the SEM - Higher magnification analysis

     

     

    EBSD analysis with 0.5 µm step size

    The material show a uniform pure alfa phase microstructure, and lead particles.

    Specimen surface was parallel with extrusion direction (X=ED). Surface was OP-S-polished.

    FSD image of the area for EBSD analysis. Lead particles are seen, in lines along ED.
    IPF-Z EBSD map with colours according to crystal orientations in Z direction (transverse dir.).
    EBSD phase map, alpha phase is red and in beta phase is blue. Grain boundaries (>15°) are included as well as low angle boundaries (2-15°).
    EBSD map showing IPF in X direction (extrusion dir.). Grain boundaries (black) and twins (red) are included in the image.

    Grain- and phase boundaries

    Same description as before, we see in this material a tendency to have low angle boundaries. Some twins seem to have been rotated away from the ideal twin relation. And in the previous IPF maps there are shifts of colour within grains. The assumption would be that some plastic deformation occurred after recrystallisation during extrusion.

    Grain boundaries (>15°) are black.
Low angle boundaries (2-15°) are thin black.
Twin boundaries (60°<111>) are red. Grain boundaries (>15°) are black. Low angle boundaries (2-15°) are thin black. Twin boundaries (60°<111>) are red.

    EDS mapping in parallel to EBSD analysis

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    Large area mapping – Many (>40) analyses stitched together

    The large area make statistics for grain size, phase fractions, texture, etc. better and now it is obvious that there are preferred orientations in X (ED).

    Alpha texture: Main component <100>//ED (red) Also <111>//ED (blue) 26 times random
    The pole figure show texture components for the alpha phase, strong  <100>//ED (22 times random). The pole figure show texture components for the alpha phase, strong  <100>//ED (22 times random).

    Grain size, area weighted distribution

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